Varistor performance of nanocrystalline Zn–Bi–O thin films prepared by reactive RF magnetron sputtering at room temperature

نویسندگان

  • W. Mi
  • J. Ziaja
چکیده

The Zn–Bi–O films were deposited by reactive radio frequency magnetron sputtering in oxygen atmosphere from ZnBi alloy target (wt% ratio Zn:Bi=9:1) on glass substrate at room temperature. The XRD patterns show that the films deposited on tin-doped indium oxide/glass substrates were nanocrystalline. The microstructure of Bi-doped ZnO films was studied by scanning electron microscopy in combination with energy dispersive X-ray spectroscopy. All the obtained layers had varistor-type non-linear current–voltage (I–V) characteristics with low breakdown voltage varying from few tenths of a volt to few volts. r 2004 Elsevier Ltd. All rights reserved.

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تاریخ انتشار 2004